Provides statistical process control tools for stochastic textured surfaces. The current version supports the following tools: (1) generic modeling of stochastic textured surfaces. (2) local defect monitoring and diagnostics in stochastic textured surfaces, which was proposed by Bui and Apley (2018a) <doi:10.1080/00401706.2017.1302362>. (3) global change monitoring in the nature of stochastic textured surfaces, which was proposed by Bui and Apley (2018b) <doi:10.1080/00224065.2018.1507559>. (4) computation of dissimilarity matrix of stochastic textured surface images, which was proposed by Bui and Apley (2019b) <doi:10.1016/j.csda.2019.01.019>.
| Version: | 0.5.2 |
| Depends: | LS2Wstat, rpart, gridExtra, parallel |
| Published: | 2019-12-09 |
| Author: | Anh Tuan Bui [aut, cre] and Daniel W. Apley [ths] |
| Maintainer: | Anh Bui <atbui at u.northwestern.edu> |
| License: | GPL-2 |
| NeedsCompilation: | no |
| Citation: | spc4sts citation info |
| CRAN checks: | spc4sts results |
| Reference manual: | spc4sts.pdf |
| Package source: | spc4sts_0.5.2.tar.gz |
| Windows binaries: | r-devel: spc4sts_0.5.2.zip, r-release: spc4sts_0.5.2.zip, r-oldrel: spc4sts_0.5.2.zip |
| macOS binaries: | r-release: spc4sts_0.5.2.tgz, r-oldrel: spc4sts_0.5.2.tgz |
| Old sources: | spc4sts archive |
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