A collection of functions for smart sampling and sensitivity analysis for metrology applications, including computationally expensive problems.
| Version: | 1.2.1 |
| Depends: | R (≥ 2.7.0), DiceDesign, lhs, metRology, msm, sensitivity |
| Published: | 2020-05-06 |
| Author: | Severine Demeyer and Alexandre Allard, with contributions from Bertrand Iooss |
| Maintainer: | Alexandre Allard <alexandre.allard at lne.fr> |
| License: | GPL-3 |
| NeedsCompilation: | no |
| In views: | ChemPhys |
| CRAN checks: | ATmet results |
| Reference manual: | ATmet.pdf |
| Package source: | ATmet_1.2.1.tar.gz |
| Windows binaries: | r-devel: ATmet_1.2.1.zip, r-release: ATmet_1.2.1.zip, r-oldrel: ATmet_1.2.1.zip |
| macOS binaries: | r-release: ATmet_1.2.1.tgz, r-oldrel: ATmet_1.2.1.tgz |
| Old sources: | ATmet archive |
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